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Marketing and sales of Hitachi electron microscopes, 3D optical interferometry system and precision analysis tools


Unit 01, 26/F, Tower 1, Ever Gain Plaza, 88 Container Port Road, Kwai Chung, N.T., Hong Kong

Major Products & Business Overview

UV-Vis/NIR Spectrophotometer

picture:  UV-Vis/NIR Spectrophotometer

Hitachi UV-Vis/NIR Spectrophotometer utilize advanced technologies to measure transmittance and reflectance for different kinds of materials and requirements

Fluorescence Spectrophotometer

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World-class Fluorescence Spectrophotometer.
3D Fingerprint,
EEM View

Atomic Absorption Spectrophotometer

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Unique polarized Zeeman background correction method and dual detector. High precision and sensitive analysis.

High Pressure Liquid Chromatograph

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Primaide, Chromaster, Chromaster Ultra
Outstanding performance
Easy to use

Amino Acid Analyzer

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LA8080 (desktop/floortop)
High speed
Post-column ninhydrin derivatization method
Compact design for saving space
Operation could be achieved within 32 second of training

Automatic Titrators

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Potentiometric Titrator
Karl Fischer Titrator
Mercury Analyzer

Atomic Force Microscopes

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The AFM5500M is an AFM platform equipped with a fully addressable 4-inch stage, optimized for medium-sized samples.

Focused Ion Beam Systems

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The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion optics for nanoscale precision processing.

Field Emission Scanning Electron Microscopes

picture: Field Emission Scanning Electron Microscopes

As a new brand of FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, Regulus8220, Regulus8230, and Regulus8240, all of which extend the functions of the SU8200 series with the use of a common platform. With optimized electron optical systems, the new Regulus series features resolutions down to 0.7 nm in the Regulus8220/8230/8240 models and 0.8 nm in the Regulus8100 model. The Regulus series employs a novel cold-field-emission (CFE) gun optimized for high-resolution imaging at low accelerating voltages. This CFE gun makes it possible to magnify high-resolution images up to 2 million times*1, compared with 1 million times in previous models. User-support functions have also been enhanced so that the advanced performance of the series can be fully leveraged, including functions to assist the operation of the signal detection system for analyzing diverse types of materials, as well as device-maintenance functions.
*1 Only in Regulus8220/8230/8240

Scanning Electron Microscopes

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Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.

Tabletop Microscope

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The TM4000 Series features innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized imaging, and high-image quality, while maintaining the compact design of the well-established Hitachi TM Series products. Experience the new dimension of tabletop microscopes with the Hitachi TM4000 II and TM4000Plus II.

Electronic Microscope

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The HT7800 RuliTEM is a 120 kV transmission electron microscope (TEM) with multiple lens configurations, including a standard lens for unsurpassed high contrast and a class-leading HR lens for high resolution. It represents the cutting-edge solution for modern TEM analyses.

Electronic Microscope

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The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy.

Nanoscale 3D Optical Interferometry System

picture: Nanoscale 3D Optical Interferometry System

Nano scale 3D optical interferometry system vs1800 uses optical interference phenomenon to measure micro surface morphology, which can achieve high-precision measurement required by high-performance film, semiconductor, auto parts, display and other industries. It can also be used to measure the layer structure and the foreign matter inside the multilayer in a non-destructive way.